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Focusing on advanced imaging techniques, this book delves into surface physics and thin film research through the lens of low energy electron microscopy. It explores methods like LEEM, SPLEEM, SPELEEM, PEEM, and XPEEM, detailing their principles, experimental setups, and applications. The author, an innovator in the field, emphasizes the significance of these techniques in various research areas, supported by numerous illustrations that clarify electron optics and application outcomes, making it a valuable resource for researchers and practitioners in surface science.
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Surface Microscopy with Low Energy Electrons, Erns W. Bauer
- Langue
- Année de publication
- 2016
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