Surface Microscopy with Low Energy Electrons
- 516pages
- 19 heures de lecture
Focusing on advanced imaging techniques, this book delves into surface physics and thin film research, highlighting methods utilizing low energy electrons. It provides in-depth coverage of innovative techniques such as Low Energy Electron Microscopy (LEEM), Spin-Polarized Low Energy Electron Microscopy (SPLEEM), and Photoemission Electron Microscopy (PEEM), among others. The author, a pioneer in the field, presents fundamental principles, experimental setups, and practical applications, complemented by numerous illustrations to enhance understanding of electron optics and results.







