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Focusing on the advancements in material analysis, this conference brought together experts from 21 countries to discuss ion beam techniques, including backscattering, channeling, and ion-induced X-rays. With 7 invited papers and 85 contributions, the event emphasized technical challenges and novel applications. Participants engaged in detailed discussions across various sessions, fostering collaboration and knowledge sharing. The proceedings include all papers presented, while summaries of discussions will be published separately, highlighting the growing importance of ion beam surface layer analysis.
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Ion Beam Surface Layer Analysis, Otto Meyer
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- Année de publication
- 2013
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