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Focusing on advanced microscopy techniques, this book offers an in-depth exploration of reflection electron microscopy, reflection high-energy electron diffraction, and reflection electron energy-loss spectroscopy. It is structured into three parts: diffraction, imaging, and spectroscopy, integrating fundamental techniques with practical applications and experimental theories. Additionally, it provides essential reference materials, including FORTRAN source codes for crystal structure calculations, making it a valuable resource for researchers and graduate students in physics and materials science.
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Reflection Electron Microscopy and Spectroscopy for Surface Analysis, Zhong Lin Wang
- Langue
- Année de publication
- 2005
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