Le livre est actuellement en rupture de stock
En savoir plus sur le livre
This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise.
Achat du livre
Test and Diagnosis for Small-Delay Defects, Mohammad Tehranipoor
- Langue
- Année de publication
- 2011
- product-detail.submit-box.info.binding
- (rigide)
Nous vous informerons par e-mail dès que nous l’aurons retrouvé.
Modes de paiement
Il manque plus que ton avis ici.