Testing Integrated Circuits

Auteurs

• Mikhail Itskovich

Paramètres

• Électrotechnique
• Technologie / Ingénierie

En savoir plus sur le livre

This book teaches how to design and manufacture a testing system for the next generation of integrated circuits. ... The growing efficiency in manufacturing of semiconductor devices combined with increased speed, size and performance of integrated products puts an incredible pressure on testing and verification technology. While negligible in the past, the cost of verification for a modern semiconductor design can be as high as half of the total manufacturing cost. In order to accommodate testing requirements, modern test equipment must operate up to 100 times faster than the state-of-the-art production circuits while using technologies several generations older. ... This book teaches how to test future generations of integrated circuits by using transient currents measured at the power nodes.

Achat du livre

• Année de publication: 2014
• Reliure: (souple)