Doru Constantin Lupascu Livres

Focusing on the complex mechanisms behind material fatigue in ferroelectric devices, this book explores bulk material effects and their implications for reliability in mass markets. It details mechanical, electrical, and physico-chemical processes, providing reference data for various loading regimes and boundary conditions. Additionally, it compares different fatigue models and highlights how acoustic emission and microscopy studies uncover the microscopic origins of fatigue, offering valuable insights into improving device performance.