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NanoScience and Technology: Atomic Force Microscopy

Second Edition

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The book explains the operating principles of atomic force microscopy to enable readers to operate a scanning probe microscope successfully and to understand the data obtained. The chapters on the scanning probe techniques are complemented by chapters on fundamentals and important technical aspects. This book is primarily intended for graduate students in physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.

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NanoScience and Technology: Atomic Force Microscopy, Bert Voigtländer

Langue
Année de publication
2019
product-detail.submit-box.info.binding
(rigide),
État du livre
Très bon
Prix
67,99 €

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Titre
NanoScience and Technology: Atomic Force Microscopy
Sous-titre
Second Edition
Langue
Anglais
Éditeur
Springer
Publié
2019
Format
rigide
Pages
345
ISBN10
3030136531
ISBN13
9783030136536
Séries
Évaluation
5 sur 5
Description
The book explains the operating principles of atomic force microscopy to enable readers to operate a scanning probe microscope successfully and to understand the data obtained. The chapters on the scanning probe techniques are complemented by chapters on fundamentals and important technical aspects. This book is primarily intended for graduate students in physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.