Thin Film Materials

Stress, Defect Formation and Surface Evolution

Auteurs

• L. B. Freund
• S. Suresh

Paramètres

• 770 pages
• 27 heures de lecture

• Science
• Technologie

En savoir plus sur le livre

This book provides comprehensive coverage of stress, defect formation and surface evolution in thin films. With its balanced coverage of theory, experiment and simulation and many homework problems, the text will be essential reading in senior undergraduate and graduate courses on thin films.

Achat du livre

• Année de publication: 2004
• Reliure: (souple)