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Advanced Characterization Techniques for Thin Film Solar Cells

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  • 547pages
  • 20 heures de lecture

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Written by scientists from leading institutes in Germany, the USA, and Spain, this text offers concise, comprehensive chapters on specific research methods relevant to photovoltaic devices. It emphasizes emerging techniques that are new to the field yet have proven significance. An introductory chapter outlines the basic physics of thin-film solar cells and modules, guiding readers through the advantages of each method. The selected topics represent a cross-section of methods that have gained visibility in recent scientific literature, addressing device-related issues and including material and surface/interface analysis techniques that have recently demonstrated their importance. Additionally, the text presents simulation techniques for ab-initio calculations of relevant semiconductors and device simulations in 1D and 2D. This resource is tailored for students in physics, solid-state physics, and materials science, as well as PhD candidates, materials institutes, semiconductor physicists, and professionals in the semiconductor industry, making it a valuable supplementary resource for related courses.

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Advanced Characterization Techniques for Thin Film Solar Cells, Daniel Abou-Ras, Thomas Kirchartz, Uwe Rau

Langue
Année de publication
2011
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(rigide),
État du livre
Très bon
Prix
16,26 €

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