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Authored by a university professor with extensive experience in X-ray diffraction research, this textbook is grounded in over 20 years of lectures to graduate students. It presents a balanced approach to basic concepts and experimental techniques, establishing X-ray diffraction as a premier method for studying material structures. The text unifies both dynamical and kinematic X-ray diffraction, using dynamical diffraction in single-scattering approximation as a bridge between the two. It highlights fundamental laws governing X-ray interactions with matter while delving into classical and modern applications, such as line broadening, texture and strain/stress analyses, X-ray mapping in reciprocal space, high-resolution diffraction, X-ray focusing, and inelastic and time-resolved scattering. The book offers unique insights, including analytic expressions for simulating diffraction profiles in thin-film heterostructures and the interaction of X-rays with phonons. Its compact and self-contained format makes it suitable for students specializing in materials science, physics, chemistry, or biology. Clear illustrations, an accessible writing style, and concise chapters enhance comprehension, making this resource essential for serious users of X-ray diffraction techniques.
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Basic concepts of X-ray diffraction, Emil Zolotoyabko
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- Année de publication
- 2014
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